mirror of
https://github.com/DarkFlippers/unleashed-firmware.git
synced 2025-12-12 04:34:43 +04:00
9e42e00ead
* toolbox, gui: fixes for compressed icon handling * ufbt: fixes for generated vscode project * scripts: increased max dimensions for image converter * icon type changes * linter fixes; api sync * gui: docs fix * toolbox: fixed potential decoder buffer overflow * minor cleanup * fbt: sdk: suppressed deprecation warnings in API table * toolbox: compress: added unit tests vscode: now installs resources for unit_tests unit_tests: now loads subghz region data * toolbox: compress: review fixes, pt 1 * compress: now passes decoder buffer size as constructor argument; auto-resize decoder buffer; crash on failed icon decompression * PVS fixes * pvs fixes, pt2 * doxygen fixes * investigating unit test failures * investigating unit test failures * investigating unit test failures * investigating unit test failures * investigating unit test failures * UnitTests: move all tests into plugins, brakes testing * UnitTests: add plugin API and update plugin entrypoints * UniTests: Test runner that works with plugins * fbt: extra filtering for extapps to include in build * UnitTests: filter tests by name * loader: restored API table for unit_test build config * Add various missing symbols to API table * UnitTest: fail on plugin load error * UnitTests: cleanup plugin api and reporting * unit_tests: composite resolver * UnitTests: remove unused declaration * unit_tests, nfc: moved mock nfc implementation to libnfc * unit_tests: api: removed redundant #define * toolbox: compress: removed size_hint for icons; triggering furi_check on oversized icons * gui: icon, icon_animation: removed size hit APIs * Format Sources. Cleanup code. * loader: refuse to start .fal as app * toolbox: compress: fixed memory corruption in operations with small destination buffer; added unit tests for that case * unit_tests: proper test skipping; better selective test interface * unit_tests: moved 'loading' logging to proper location Co-authored-by: あく <alleteam@gmail.com>
72 lines
3.0 KiB
C
72 lines
3.0 KiB
C
#include <furi.h>
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#include <furi_hal.h>
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#include "../test.h"
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static void power_test_deinit(void) {
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// Try to reset to default charge voltage limit
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furi_hal_power_set_battery_charge_voltage_limit(4.208f);
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}
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MU_TEST(test_power_charge_voltage_limit_exact) {
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// Power of 16mV charge voltage limits get applied exactly
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// (bq25896 charge controller works in 16mV increments)
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//
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// This test may need adapted if other charge controllers are used in the future.
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for(uint16_t charge_mv = 3840; charge_mv <= 4208; charge_mv += 16) {
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float charge_volt = (float)charge_mv / 1000.0f;
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furi_hal_power_set_battery_charge_voltage_limit(charge_volt);
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mu_assert_double_eq(charge_volt, furi_hal_power_get_battery_charge_voltage_limit());
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}
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}
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MU_TEST(test_power_charge_voltage_limit_floating_imprecision) {
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// 4.016f should act as 4.016 V, even with floating point imprecision
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furi_hal_power_set_battery_charge_voltage_limit(4.016f);
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mu_assert_double_eq(4.016f, furi_hal_power_get_battery_charge_voltage_limit());
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}
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MU_TEST(test_power_charge_voltage_limit_inexact) {
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// Charge voltage limits that are not power of 16mV get truncated down
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furi_hal_power_set_battery_charge_voltage_limit(3.841f);
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mu_assert_double_eq(3.840, furi_hal_power_get_battery_charge_voltage_limit());
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furi_hal_power_set_battery_charge_voltage_limit(3.900f);
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mu_assert_double_eq(3.888, furi_hal_power_get_battery_charge_voltage_limit());
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furi_hal_power_set_battery_charge_voltage_limit(4.200f);
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mu_assert_double_eq(4.192, furi_hal_power_get_battery_charge_voltage_limit());
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}
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MU_TEST(test_power_charge_voltage_limit_invalid_clamped) {
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// Out-of-range charge voltage limits get clamped to 3.840 V and 4.208 V
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furi_hal_power_set_battery_charge_voltage_limit(3.808f);
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mu_assert_double_eq(3.840, furi_hal_power_get_battery_charge_voltage_limit());
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furi_hal_power_set_battery_charge_voltage_limit(1.0f);
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mu_assert_double_eq(3.840, furi_hal_power_get_battery_charge_voltage_limit());
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// NOTE: Intentionally picking a small increment above 4.208 V to reduce the risk of an
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// unhappy battery if this fails.
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furi_hal_power_set_battery_charge_voltage_limit(4.240f);
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mu_assert_double_eq(4.208, furi_hal_power_get_battery_charge_voltage_limit());
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// Likewise, picking a number that the uint8_t wraparound in the driver would result in a
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// VREG value under 23 if this test fails.
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// E.g. (uint8_t)((8105-3840)/16) -> 10
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furi_hal_power_set_battery_charge_voltage_limit(8.105f);
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mu_assert_double_eq(4.208, furi_hal_power_get_battery_charge_voltage_limit());
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}
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MU_TEST_SUITE(test_power_suite) {
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MU_RUN_TEST(test_power_charge_voltage_limit_exact);
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MU_RUN_TEST(test_power_charge_voltage_limit_floating_imprecision);
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MU_RUN_TEST(test_power_charge_voltage_limit_inexact);
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MU_RUN_TEST(test_power_charge_voltage_limit_invalid_clamped);
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power_test_deinit();
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}
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int run_minunit_test_power(void) {
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MU_RUN_SUITE(test_power_suite);
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return MU_EXIT_CODE;
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}
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TEST_API_DEFINE(run_minunit_test_power)
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